Tratos at the IEC Annual General Meeting

/ / / Tratos at the I…

Dr Maurizio Bragagni, was in Shanghai this month where senior team members joined around 4,000 delegates from 173 countries for the 83rd annual general meeting of the IEC (International Electrotechnical Commission).

Company CEO and Chair Dr Maurizio Bragagni met with other industry leaders, technology experts, regulators, academics and a range of stakeholders to explore future goals and take stock of IEC standardization and conformity assessment work.

Dr Bragagni was also invited to contribute, for the first time, to the IEC’s Marketing Strategy Board, just a few days after receiving a commendation from the Institute of Directors in the UK.

The IEC, the world’s leading organization publishing international standards for electronics-related technologies, also listed Tratos’ Queens Award for Enterprise: Innovation celebration event as part of the event’s itinerary.

Tratos Ltd, part of the Tratos Group, which won the UK’s most prestigious award for ahead-of-its-time cable compound innovation, organised the event to celebrate with global customers and partners.

Dr Bragagni was at the IEC to champion continuous professional development and learning linked to technology.  He met a series of senior influencers including IEC Market Strategy Board Secretary Peter Lanctot, David Bell from National Standards Body BSI, Dominic Lyons from the British Consulate General, Shanghai and Weifeng Ma from the China British Council.

A world event, the organisation behind it, the IEC is more than a purely technical organisation.  It is dedicated to promoting international benefits from the advancement of technology. This year’s meeting theme was “Better Quality Better Life ― Reliability, Safety, Efficiency”, with sustainability a major theme.

The conference included an IEC Advisory Committee on environmental aspects (ACEA) workshop on the circular economy. The ACEA provides guidance to the Standardization Management Board (SMB) on issues related to the environment.

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